报告人简介：
Petr Bábor is working as an assistant professor at the Central European Institute of Technology (CEITEC) and Insti-tute of Physical Engineering (IPE) both at Brno University of Technology, where he contributed to the establish-ment of shared laboratories. He is actively involved in scientific research and cooperation with companies. His primary research area focuses on the analysis of materials in the micro- and nanoworld, with an emphasis on analytical methods utilizing interactions of ions and electrons with solid matter (SIMS, LEIS, FIB, AES, SEM). He has also explored the interaction of liquids and solids, electron tweezers, and ion tomography. With twenty years of experience in secondary ion mass spectrometry, he is currently involved in observing catalytic chemical reac-tions in real-time using ion and electron microscopes.
讲座摘要：
Many conventional surface science techniques have been employed for heterogeneous catalysis research but not all of them offer sufficient chemical, spatial and temporal resolution to follow and analyze moving chemical waves. The selection of proper techniques is based on the research objectives. Our study's objective is the dynamics of catalytic CO oxidation over platinum structures at high vacuum pressures (1E-5 mbar) during the formation of chemical waves. Operando scanning electron microscopy (SEM) and operando time of flight secondary ion mass spectrometry (TOF-SIMS) were employed for the observation of gas-phase- and temperature-induced processes on platinum surfaces, mainly formation of chemical waves during CO oxidation reaction. Our research demon-strates the abilities of in-situ TOF-SIMS as a powerful technique for the real-time chemical monitoring of surface composition under formation of chemical waves. Spatio-temporal patterns of varying surface coverages were observed by both techniques during the same conditions a the TOF-SIMS was used to prove the capability to measure the chemical contrast by detection of secondary electrons by different detectors (chamber and in-lens detector). Examples of images taken using electron and ion beams are in Figure 1. The way of secondary electron contrast interpretation with the help of TOF-SIMS will be discussed in more detail.
邀请人：王竹君
Petr Bábor is working as an assistant professor at the Central European Institute of Technology (CEITEC) and Insti-tute of Physical Engineering (IPE) both at Brno University of Technology, where he contributed to the establish-ment of shared laboratories. He is actively involved in scientific research and cooperation with companies. His primary research area focuses on the analysis of materials in the micro- and nanoworld, with an emphasis on analytical methods utilizing interactions of ions and electrons with solid matter (SIMS, LEIS, FIB, AES, SEM). He has also explored the interaction of liquids and solids, electron tweezers, and ion tomography. With twenty years of experience in secondary ion mass spectrometry, he is currently involved in observing catalytic chemical reac-tions in real-time using ion and electron microscopes.
讲座摘要：
Many conventional surface science techniques have been employed for heterogeneous catalysis research but not all of them offer sufficient chemical, spatial and temporal resolution to follow and analyze moving chemical waves. The selection of proper techniques is based on the research objectives. Our study's objective is the dynamics of catalytic CO oxidation over platinum structures at high vacuum pressures (1E-5 mbar) during the formation of chemical waves. Operando scanning electron microscopy (SEM) and operando time of flight secondary ion mass spectrometry (TOF-SIMS) were employed for the observation of gas-phase- and temperature-induced processes on platinum surfaces, mainly formation of chemical waves during CO oxidation reaction. Our research demon-strates the abilities of in-situ TOF-SIMS as a powerful technique for the real-time chemical monitoring of surface composition under formation of chemical waves. Spatio-temporal patterns of varying surface coverages were observed by both techniques during the same conditions a the TOF-SIMS was used to prove the capability to measure the chemical contrast by detection of secondary electrons by different detectors (chamber and in-lens detector). Examples of images taken using electron and ion beams are in Figure 1. The way of secondary electron contrast interpretation with the help of TOF-SIMS will be discussed in more detail.
邀请人：王竹君
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